STUDI ANALISIS DATA DIFRAKSI SINAR-X PADA MATERIAL ZIRCON PASIR ALAM MELALUI METODE RIETVELD

  • Sefrilita Risqi Adikaning Rani Universitas Islam Negeri Alauddin Makassar
    (ID)

Abstract

ZrSiO4 (zircon) material derived from natural sand has been successfully synthesized to produce single crystals. Structural analysis and phase change were studied by X-Ray diffraction. Rietveld analysis was carried out as a method of analyzing X-Ray Diffraction data. Zircon with a tetragonal crystal structure has been successfully synthesized to produce single crystals of ZrSiO4 with space group I41/amd. The results of the Rietveld analysis of single crystal ZrSiO4 samples with a tetragonal structure obtained lattice parameters a= 6.602727 (323) c= 5.978810 (317) with a crystal size distribution of 527.033 (0) nm and macrostrains of 0.001x10-4.

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References

Callister, W.D., Rethwisch, D.G., 2010. Materials Science and Engineering: An Introduction. John Wiley & Sons Canada, Limited.

Cullity, B.D., 1978. Elements of X-ray Diffraction. Addison-Wesley Publishing Company.

Leng, Y., 2009. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. John Wiley & Sons.

West, A.R., 1987. Solid State Chemistry and Its Applications. John Wiley & Sons.

Young, R.A., 1993. The Rietveld Method, IUCr Monographies of Crystallography 5. Wiley, Oxford

Published
2022-08-30
How to Cite
Rani, S. R. A. (2022). STUDI ANALISIS DATA DIFRAKSI SINAR-X PADA MATERIAL ZIRCON PASIR ALAM MELALUI METODE RIETVELD. JFT: Jurnal Fisika Dan Terapannya, 9(1), 16-22. https://doi.org/10.24252/jft.v9i1.25470
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