STUDI ANALISIS DATA DIFRAKSI SINAR-X PADA MATERIAL ZIRCON PASIR ALAM MELALUI METODE RIETVELD
Abstrak
ZrSiO4 (zircon) material derived from natural sand has been successfully synthesized to produce single crystals. Structural analysis and phase change were studied by X-Ray diffraction. Rietveld analysis was carried out as a method of analyzing X-Ray Diffraction data. Zircon with a tetragonal crystal structure has been successfully synthesized to produce single crystals of ZrSiO4 with space group I41/amd. The results of the Rietveld analysis of single crystal ZrSiO4 samples with a tetragonal structure obtained lattice parameters a= 6.602727 (323) c= 5.978810 (317) with a crystal size distribution of 527.033 (0) nm and macrostrains of 0.001x10-4.
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Referensi
Callister, W.D., Rethwisch, D.G., 2010. Materials Science and Engineering: An Introduction. John Wiley & Sons Canada, Limited.
Cullity, B.D., 1978. Elements of X-ray Diffraction. Addison-Wesley Publishing Company.
Leng, Y., 2009. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods. John Wiley & Sons.
West, A.R., 1987. Solid State Chemistry and Its Applications. John Wiley & Sons.
Young, R.A., 1993. The Rietveld Method, IUCr Monographies of Crystallography 5. Wiley, Oxford
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